Webinar special – Analyzing Electronic Products with Near Field Scanning Technology
We would like to invite you to join our 2nd Live Webinar, hosted by Y.I.C. Technologies presented by Prof. Arturo Mediano. He will discuss Analyzing Electronic Products with Near Field Scanning Technology . The purpose is to demonstrate how the designer can evaluate a product or prototype to be able to confirm how the RF energy is controlled to minimize EMC problems.
We will cover spectra/spatial scans, the detection of peaks, the 2D/3D views and we will introduce the „interleaved scan“ – a very useful tool to obtain high resolution images.
Analyzing Electronic Products with Near Field Scanning Technology
Arturo Mediano received his M.Sc. (1990) and his Ph. D. (1997) in Electrical
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From everyone at Y.I.C. Technologies
Link zur Veranstaltungsseite - https://yictechnologiesltd.my.webex.com/yictechnologiesltd.my/j.php?RGID=rd3d560d8c2cfe15ea2bb402475110fa3