Webinar special – Analyzing Electronic Products with Near Field Scanning Technology

We would like to invite you to join our 2nd Live Webinar, hosted by Y.I.C. Technologies presented by Prof. Arturo Mediano.  He will discuss Analyzing Electronic Products with Near Field Scanning Technology .  The purpose is to demonstrate how the designer can evaluate a product or prototype to be able to confirm how the RF energy is controlled to minimize EMC problems.

We will cover spectra/spatial scans, the detection of peaks, the 2D/3D views and we will introduce the „interleaved scan“ – a very useful tool to obtain high resolution images.

Analyzing Electronic Products with Near Field Scanning Technology 
22^nd March 2021 @ 11am GMT
Register Here:

Agenda:
We will analyze a real example including PCB, cables and shielding so we can analyze the design from different points of view:
1 – Layout of PCB
2 – Differential and Common Mode EMI in cables
3 – Leakage in shielded areas

      Arturo Mediano received his M.Sc. (1990) and his Ph. D. (1997) in Electrical
Engineering from University of Zaragoza (Spain), where he has held a teaching
professorship in EMI/EMC/RF/SI from 1992.
He is the founder of The HF-Magic Lab®, a specialized laboratory for design,
diagnostic, troubleshooting, and training in the EMI/EMC/SI and RF fields
at I3A (University of Zaragoza). Arturo can be reached at a.mediano@ieee.org.

         
If there is anything else we can assist you with, please let us know: support@yictechnologies.com

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From everyone at Y.I.C. Technologies