Webinar – Secrets of Near and Far Field Scanning
We would like to invite you to join our 3rd Live Webinar hosted by Y.I.C. Technologies.
Prof. Arturo Mediano will continue with the EMC Journey. We will review the fundamentals of Near Field Scanning to debugging EMI/EMC problems.
A real-time setup, including a DC/DC Converter, an Microcontroller Board, LCD, and RFID blocks, will be analyzed in the Spectral and Spatial scan modes to find hot areas in the design, aggressive signals and to propose solutions. Interconnecting cables will be analyzed for Common Mode Emissions, checking the efficiency of Ferrites to minimize currents running through the cables.
Finally a High Resolution Scanner will be presented, which is especially useful for very small components (ICs) or small-high populated PCBs.
Register today: Secrets of Near and Far Field Scanning
Arturo Mediano received his M.Sc. (1990) and his Ph. D. (1997) in Electrical Engineering from University of Zaragoza (Spain), where he has held a teaching professorship in EMI/EMC/RF/SI from 1992.
Link zur Veranstaltungsseite - https://yictechnologiesltd.my.webex.com/yictechnologiesltd.my/j.php?RGID=r332243ce08288170568c8a14212de9f7