Webinar – Modulation Distortion with Load Pull

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Keysight Technologies

Webinar – Modulation Distortion with Load Pull

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VNA Active Device Characterization Essentials Webinar Series

Power amplifier designers need accurate device models to minimize design cycle. Key performance metrics to measure include error vector magnitude (EVM), adjacent-channel leakage ratio (ACLR), output power, and gain. Characterizing transistor behaviour with modulated stimulus under varying load conditions allows for more accurate device models, shortening time to market. 

In part 1 of this webinar series, VNA Active Device Characterization Essentials, you will learn how to perform calibrated EVM measurements using a vector network analyzer with a modulation-distortion application and a vector signal generator. Our evolved approach allows for integrated control of a tuner to perform modulated transistor characterization under load pull conditions

Presenters

Nizar Messaoudi
Nizar Messaoudi
PNA Product Manager
Keysight Technologies

Vincent Mallette
Vincent Mallette
Executive VP
Focus Microwave

Gabrielle Duncan
Gabrielle Duncan
Product Marketing Manager
Keysight Technologies

Additional Details

Preis -

Link zur Veranstaltungsseite - https://connectlp.keysight.com/LP=34110

 

Date And Time

19. Juli 2022 @ 10:00 to
19. Juli 2022 @ 11:00
 

Ort

 

Veranstaltungskategorie

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