Webinar – Modulation Distortion with Load Pull
VNA Active Device Characterization Essentials Webinar Series
Power amplifier designers need accurate device models to minimize design cycle. Key performance metrics to measure include error vector magnitude (EVM), adjacent-channel leakage ratio (ACLR), output power, and gain. Characterizing transistor behaviour with modulated stimulus under varying load conditions allows for more accurate device models, shortening time to market.
In part 1 of this webinar series, VNA Active Device Characterization Essentials, you will learn how to perform calibrated EVM measurements using a vector network analyzer with a modulation-distortion application and a vector signal generator. Our evolved approach allows for integrated control of a tuner to perform modulated transistor characterization under load pull conditions
Link zur Veranstaltungsseite - https://connectlp.keysight.com/LP=34110