Webinar – Modulation Distortion with Load Pull

<p><!-- wp:paragraph --></p> <p><strong>VNA Active Device Characterization Essentials Webinar Series</strong></p> <p><!-- /wp:paragraph --></p> <p><!-- wp:paragraph --></p> <p>Power amplifier designers need accurate device models to minimize design cycle. Key performance metrics to measure include error vector magnitude (EVM), adjacent-channel leakage ratio (ACLR), output power, and gain. Characterizing transistor behaviour with modulated stimulus under varying load conditions allows for more accurate device models, shortening time to market. </p> <p><!-- /wp:paragraph --></p> <p><!-- wp:paragraph --></p> <p>In part 1 of this webinar series, VNA Active Device Characterization Essentials, you will learn how to perform calibrated EVM measurements using a vector network analyzer with a modulation-distortion application and a vector signal generator. Our evolved approach allows for integrated control of a tuner to perform modulated transistor characterization under load pull conditions</p> <p><!-- /wp:paragraph --></p> <p><!-- wp:spacer {"height":"40px"} --></p> <div style="height:40px" aria-hidden="true" class="wp-block-spacer"></div> <p><!-- /wp:spacer --></p> <p><!-- wp:heading --></p> <h2>Presenters</h2> <p><!-- /wp:heading --></p> <p><!-- wp:spacer {"height":"20px"} --></p> <div style="height:20px" aria-hidden="true" class="wp-block-spacer"></div> <p><!-- /wp:spacer --></p> <p><!-- wp:columns --></p> <div class="wp-block-columns"><!-- wp:column --></p> <div class="wp-block-column"><!-- wp:image {"align":"left","width":172,"height":171} --></p> <figure class="wp-block-image alignleft is-resized"><img src="https://images.connection.keysight.com/EloquaImages/clients/KeysightTechnologiesInc/%7Bd69a2725-4ee8-4713-89a7-6b8f3921bc0b%7D_Messaoudi__Nizar.png" alt="Nizar Messaoudi" width="172" height="171" /><figcaption><strong>Nizar Messaoudi</strong><br />PNA Product Manager<br />Keysight Technologies</figcaption></figure> <p><!-- /wp:image --></div> <p><!-- /wp:column --></p> <p><!-- wp:column --></p> <div class="wp-block-column"><!-- wp:image {"align":"left","width":172,"height":178} --></p> <figure class="wp-block-image alignleft is-resized"><img src="https://images.connection.keysight.com/EloquaImages/clients/KeysightTechnologiesInc/%7B40c727f0-ff5d-429f-8c9b-c9ba568605fe%7D_Mallette__Vince.png" alt="Vincent Mallette" width="172" height="178" /><figcaption><strong>Vincent Mallette</strong><br />Executive VP<br />Focus Microwave</figcaption></figure> <p><!-- /wp:image --></div> <p><!-- /wp:column --></p> <p><!-- wp:column --></p> <div class="wp-block-column"><!-- wp:image {"align":"left","width":170,"height":170} --></p> <figure class="wp-block-image alignleft is-resized"><img src="https://images.connection.keysight.com/EloquaImages/clients/KeysightTechnologiesInc/%7Bd1e70f2e-0bcf-4a7b-8948-ce4d3042db3a%7D_Duncan__Gabrielle.png" alt="Gabrielle Duncan" width="170" height="170" /><figcaption><strong>Gabrielle Duncan</strong><br />Product Marketing Manager<br />Keysight Technologies</figcaption></figure> <p><!-- /wp:image --></p> <p><!-- wp:spacer {"height":"20px"} --></p> <div style="height:20px" aria-hidden="true" class="wp-block-spacer"></div> <p><!-- /wp:spacer --></div> <p><!-- /wp:column --></div> <p><!-- /wp:columns --></p>