Webinar – EMI/EMC Design and Troubleshooting with Near Field Scanning Tools

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YIC Technologies

Webinar – EMI/EMC Design and Troubleshooting with Near Field Scanning Tools

von YIC Technologies
 
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Hi Everyone,

We would like to invite you to join a Live Webinar, hosted by Y.I.C. Technologies.  We appreciate that it is a difficult time for businesses, but we would like to take this opportunity to get in touch and address EMI/EMC design & troubleshooting.
Other topics will follow during the year.

EMI/EMC DESIGN AND TROUBLESHOOTING WITH NEAR FIELD SCANNING TOOLS
5th May 2020 at 11:00 CET.

Register Here

Enjoy a really practical and useful lecture discovering the fundamentals of practical EMI/EMC design and troubleshooting electronic circuits using near field scanning tools.
Discover really powerful design and troubleshooting techniques along with tools to “see” and “feel” your problems. 

Presented by:

Prof. Arturo Mediano | University of Zaragoza

Arturo Mediano received his M.Sc. (1990) and his Ph.D. (1997) in Electrical Engineering from University of Zaragoza (Spain), where he has held a teaching professorship in EMI/EMC/RF/SI from 1992.

He is the founder of The HF-Magic Lab®, a specialized laboratory for design, diagnostic, troubleshooting, and training in the EMI/EMC/SI and RF fields at I3A (University of Zaragoza).

 

Date And Time

5. Mai 2020 @ 11:00 to
@ 12:30
 

Ort

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Veranstaltungskategorie

Webinar
 
 
 

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