Webinar – Adressing FEC Challenges on your Next Generation 800G Designs

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Keysight Technologies

Webinar – Adressing FEC Challenges on your Next Generation 800G Designs

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Summary

Test procedures for 400G have changed significantly over the last few years. As data rates increase, serial links no longer run error free. As a result, forward error correction (FEC) is a necessity in the 400G world and beyond and introduces new test challenges. Although it restores error-free data, certain conditions can overwhelm FEC, resulting in lost data. When FEC fails, you need to quickly debug the issues. 
In this webinar you will discover tools for debugging and solving your FEC test challenges.

Join this one-hour webinar to learn more about:

  • PAM4 and FEC test challenges
  • 400G test procedures and moving towards 800G
  • Tools for debugging and solving FEC test challenges

Speakers

Steve Sekel
Steve Sekel

400G Solutions Specialist

Keysight Technologies

Sanjay Cartic
Sanjay Cartic

Principal FPGA EngineerIxia Labs

Keysight Technologies

Additional Details

Link zur Veranstaltungsseite - https://connectlp.keysight.com/FEC-challenges-next-generation-800G-designs

 

Date And Time

4. August 2021 @ 11:00 to
4. August 2021 @ 12:00
 

Ort

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